Read Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

David J. Dumin

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Description:This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.Contents: Oxide Wearout, Breakdown, and Reliability "(D J Dumin)"Reliability of Flash Nonvolatile Memories "(N Mielke & J Chen)"Physics and Chemistry of Intrinsic Time-Dependent Dielectric Breakdown in SiO2 Dielectrics "(J W McPherson)"Breakdown Modes and Breakdown Statistics of Ultrathin SiO2 Gate Oxides "(J Sune et al.)"MOSFET Gate Oxide Reliability: Anode Hole Injection Model and Its Applications "(Y-C Yeo et al.)"Readership: Reliability and manufacturing engineers, as well as researchers and academics in the areas of semiconductor devices, semiconductor manufacturing and semiconductor device reliability."We have made it easy for you to find a PDF Ebooks without any digging. And by having access to our ebooks online or by storing it on your computer, you have convenient answers with Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability. To get started finding Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability, you are right to find our website which has a comprehensive collection of manuals listed.
Our library is the biggest of these that have literally hundreds of thousands of different products represented.

Pages: 281

Format: PDF, EPUB & Kindle Edition

Publisher: World Scientific Publishing Company

Release: 2014

ISBN: 1299741843

Description: This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.Contents: Oxide Wearout, Breakdown, and Reliability "(D J Dumin)"Reliability of Flash Nonvolatile Memories "(N Mielke & J Chen)"Physics and Chemistry of Intrinsic Time-Dependent Dielectric Breakdown in SiO2 Dielectrics "(J W McPherson)"Breakdown Modes and Breakdown Statistics of Ultrathin SiO2 Gate Oxides "(J Sune et al.)"MOSFET Gate Oxide Reliability: Anode Hole Injection Model and Its Applications "(Y-C Yeo et al.)"Readership: Reliability and manufacturing engineers, as well as researchers and academics in the areas of semiconductor devices, semiconductor manufacturing and semiconductor device reliability."We have made it easy for you to find a PDF Ebooks without any digging. And by having access to our ebooks online or by storing it on your computer, you have convenient answers with Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability. To get started finding Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability, you are right to find our website which has a comprehensive collection of manuals listed.
Our library is the biggest of these that have literally hundreds of thousands of different products represented.

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